advantest TAS7000 成像系統(tǒng)

3D Imaging Analysis Systemimg_tas7000_0001TAS7000 3D Imaging Analysis SystemThe TAS7000(?1) 3D(?2) imaging analysis system exploits the unique properties of terahertz waves(?3).The TAS7000 enables 3D non-destructive analysis of the internal structure and chemical composition of the target ; the results are shown on a 3D display. In addition, this system enables measurement of spectral characteristics and 2D(?4) mapping.Advantest has developed an unprecedented solution for 3D analysis of industrial materials such as plastics and ceramics, as well as pharmaceutical products.?1: TAS7000 = This system was developed by Advantest in collaboration with Prof. Dr. Kodo Kawase of Nagoya University.?2: 3D = Three-dimensional?3: Terahertz waves = Region of electromagnetic spectrum between hundred gigahertz to tens of terahertz.?4: 2D = Two-dimensional

A global first: non-destructive 2D and 3D analysis utilizing Terahertz waveThe TAS7000 enables non-destructive, 2D and 3D analysis of the internal composition and structure of measurement targets, utilizing computed tomography (CT) and exploiting the unique properties of terahertz waves.The TAS7000 enables not only analysis of the structural homogeneity of an internal substance, but also identification of constituents and quantitative distribution measurement.Moreover, in contrast with other regions of the electromagnetic spectrum, terahertz waves can penetrate various types of materials with moderate transmittance, allowing for analysis.High-speed measurement utilizes Advantest's terahertz optical sampling technologyThe TAS7000 relies on Advantest's newly developed, ultra-short pulse femtosecond optical fiber laser technology for terahertz wave generation and detection, and utilizes the company's original terahertz wave high-speed optical sampling technique. Thus, it delivers measurement throughput approximay 1000 times greater than the previous system.Broadband terahertz wave spectroscopic analysis up to 3THzThe TAS7000 enables broadband, high-resolution spectroscopic analysis up to a maximum analytical frequency of 3THz. The system is ideally suited for acquiring fingerprint spectra of a comprehensive range of chemical, industrial, and biological materials. For high precision, the system has the option to remove water vapor from the sample chamber by flowing dry air during the measurement.

SpecificationsApplications Non-destructive analysis, 3D constituent density distribution analysis, 3D spectroscopic measurementAnalytical functions 2D / 3D computed tomography (CT) density distribution analysisTerahertz spectroscopic transmission analysis:2D / 3D CT spectroscopic measurement mode2D spectroscopic measurement mode (mapping measurement)Spectroscopic measurement modeAnalytical frequency range (?1) High dynamic range module : 0.02THz to 0.6THz Broadband module (?2) : 0.05THz to 3THzDynamic range (?1) High dynamic range module : ≥60dB (at peak, 3min.)Broadband module : ≥50dB (at peak, 15min.)Spatial resolution of CT measurement function (?1) ≤3mm (using wire phantom; modulation transfer function (MTF), 10%)Throughput Maximum waveform acquisition speed : 250Hz?(Spectroscopic measurement mode)Acquisition time for CT cross section : ≤15min.?(Measurement of 1 CT cross section is divided into 64×64)Maximum sample size and weight ≤φ310mm (12.2inch) × 310mm (12.2inch) (H)≤20kgOperating environment Temperature : +10°C to +30°C Relative humidity : ≤80% (non-condensing)Power requirements AC100V (100-120) / 200V (220-240), 850VA, 50/60HzDimensions Size : 1500mm (W) × 1570mm (D) × 1600mm (H)Mass : 400kg or less (?3)?1: At temperatures of 23°C ±5°C.?2: With dry air option.?3: Including analysis unit and CT test bench carrier, excluding hardware options and PC.

Applications: Ceramic Filter AnalysisNon-Destructive Analysis of Ceramic Filters for Reduction of Diesel Engine EmissionsNovel method for non-destructive analysis of ceramic filtersThe DPF(?1) is a key component of the after-treatment system that reduces emissions from diesel engine exhaust gas. Analyzing accumulated PM(?2) such as soot and ash in a DPF is critical for optimizing the after-treatment system.The TAS7000 enables non-destructive analysis of the 3D-PM(?3) distribution in a DPF, as well as soot and ash analyses.img_tas7000_0004_en?1: DPF = Diesel Particulate Filter?2: PM = Particulate Matter?3: 3D = Three-dimensionalimg_tas7000_0003DPF Analysis with the TAS7000img_tas7000_0006_enMeasurement principleimg_tas7000_0007Sample DPFWhen a DPF sample is placed on the CT test bench, it is scanned with broadband terahertz radiation. By analyzing the spectral characteristics of the radiation transmitted through the sample, the system can display a data-rich graphics of the internal structure and quantitative distribution (g/L) of PM within the sample.img_tas7000_0005_enimg_tas7000_0008_en3D-PM quantitative distribution analysisof sampleimg_tas7000_0009_en2D-PM quantitative distribution analysis of sampleAdvantages of the TAS7000 for DPF AnalysisOptimizing product quality using 3D quantitative distribution analysisThe TAS7000 enables PM quantitative distribution (g/L) analysis in arbitrary areas within DPF samples, allowing developers to obtain data to visualize the thickness of soot and ash layers in detail, and to assess any changes in the internal structure of the filter. This data can facilitate the design of optimal after-treatment systems.Improving R&D efficiencyBy making it possible for the first time to analyze filter samples without physically dissecting them, development time can be sharply reduced. Additionally, repeated analyses of the same sample are possible, allowing for confirmation of results and monitoring changes in follow-up investigations.Ease of operationNo complicated setup is necessary. Samples are simply placed on the CT test bench.

advantest TAS7000 成像系統(tǒng)

Agilent 83497A 光電時鐘恢復(fù)模塊

Agilent 8157A 光衰減儀

Agilent 81637B 快速功率計

Agilent 34570A 數(shù)字萬用表

Agilent 44476A 微波復(fù)用器模塊

Agilent 70004A 光譜分析儀

Agilent 81000FI 光纖連接器

Agilent 81002FF 積分球

Agilent 81521B 光功率計探頭

Agilent 81524A 光功率探頭

Agilent 81525A 大功率光學(xué)探頭

Agilent 81533A 接口模塊

Agilent 81533B 接口模塊

Agilent 81536A 光功率計傳感插件

Agilent 81560A 可變光衰減器

Agilent 81567A 可變光衰減器模塊

Agilent 8156A 光衰減器

Agilent 81578A可變光衰減器模塊

Agilent 81610A回損測試模塊

Agilent 81619A 光功率模塊

Agilent 81624A 光學(xué)探頭

Agilent 81625A 光功率探頭

Agilent 81633A 分布式反饋(DFB)激光器

Agilent 81635A 雙光功率傳感器

Agilent 8163A光功率計主機

Agilent 8163B 光功率計

Agilent 8164A 光波測量系統(tǒng)主機

Agilent 81650A 單法布里-珀羅激光源

Agilent 81651A 光源模塊

Agilent 81654A 法布里-珀羅激光源

Agilent 81662A 分布式反饋(DFB)激光器

Agilent 8168E 可調(diào)諧激光源

Agilent 83440D光波轉(zhuǎn)換器

Agilent 83480A 數(shù)字通信分析儀

Agilent 83483A 雙通道電模塊

Agilent 83486A 光電模塊

Agilent 83487A 光電模塊

Agilent 83492A 多模時鐘模塊

Agilent 83493A 單模時鐘恢復(fù)模塊

Agilent 83494A 單模時鐘恢復(fù)模塊

Agilent 83495A 時鐘恢復(fù)模塊

Agilent 83496A 光電時鐘恢復(fù)模塊

Agilent 86100A 光示波器

Agilent 86100C 寬帶示波器主機

Agilent 86103A 光電模塊

Agilent 86103B 光電模塊

Agilent 86105A 光電模塊

Agilent 86105B 光電模塊

Agilent 86106B 光電模塊

Agilent 86107A 精密時基參考模塊

Agilent 86120B 多波長計

Agilent 86120C 多波長計

Agilent 86142B 高性能光譜分析儀

Agilent 86146b 光譜分析儀

Agilent N7740 多端口光功率計

Ando AQ2140光功率計

Ando AQ2730光功率計模塊

Ando AQ2742 光功率傳感器

Ando AQ2743 光功率傳感器

Ando AQ4211LD組件

Ando AQ4215 光功率計

Andu AQ-4137 光源

Andu AQ-4142 光源

Anritsu 69347B 信號源

Anritsu MN9610B光衰減器

Anritsu ms9710c 光譜分析儀

Anritsu MS9740A 臺式光譜分析儀

CVI Melles Griot 05-LHP-211-1 激光器

Ericsson FSU-975 光纖熔接機

Exfo IQS-3150 可變衰減器

EXFO WA-1650 光波長計

HP 8153A 光功率計

HP 8153B 光波萬用表

HP 81551MM 點光源模塊

HP 83540A 插件信號源

HP 8595E 頻譜分析儀

IFR GPS-101定位系統(tǒng)模擬器

Jdsu HA9 光衰減器

JDSU OLP-55 光功率計

Keithley 7001半導(dǎo)體開關(guān)系統(tǒng)

Keithley 2001A 數(shù)字多用表

Keithley 2400 數(shù)字源表

Keithley 2400-C 數(shù)字源表

Keithley 2500 數(shù)字源表

Keithley 2502 數(shù)字源表

KEITHLEY 6221 電流源表

Keysight 11708A 衰減器墊

Keysight 3458A 數(shù)字多用表

Keysight 34903A GP開關(guān)模塊

Keysight 81570A 可變光衰減器模塊

Keysight 81618A 接口模塊

Keysight 81623B 鍺光功率探頭

Keysight 81630B 大功率光傳感器

Keysight 81634B 低偏振相關(guān)光功率傳感器

Keysight 81636B 光功率傳感器

Keysight 8164B 光波測量系統(tǒng)主機

Keysight 82357B GPIB 卡

Keysight 86100D 寬帶寬示波器主機

Keysight 86105C 光電采樣模塊

Keysight 86105D 光電模塊

Keysight E3631A 三路輸出電源

Keysight J7231B 抖動通信性能分析儀

Keysight N5181A 射頻模擬信號發(fā)生器

Keysight N5980A 比特誤碼率測試儀

Keysight N7744A 多端口光功率計

Keysight N7748A 高性能光功率計

Newport 818-IG高性能光電二極管傳感器

Newport 918-IG 高性能光電二極管傳感器

Newport 918-ir 高性能光電二極管傳感器

NI PCI GPIB小卡

NI PXI-1031 板卡

Photom EP-712 光功率計

Picometrix PT-12B 光電轉(zhuǎn)換芯片

R&S FSP3 頻譜分析儀

R&S NRPZ51 射頻功率計